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TKS - AVOPAK brings powerful visualization and interpretation of pre-stack gather data to the interpretation desktop. Interpreters can load, view, and interpret gather data for AVO anomalies in the same project and application used to interpret their traditional stack data. Each gather can be displayed and compared to multiple data types such as the stack trace, common offset or angle stack traces, well log curves, synthetics, or extracted seismic sections—all in the same system.
The amplitudes from any horizon interpreted on a gather are automatically graphed by offset, angle, or sin of the angle, and AVO attributes from standard Zoeppritz approximations are automatically calculated. These same attributes can be extracted by horizon or on a regional volume basis and used in standard AVO cross plotting techniques to isolate the various AVO class sands, stratigraphic trends, and fluid factor. By highlighting various areas in the crossplot, the interpreter can isolate these areas and display the results in a vertical seismic section, in the map display and in TKS - VuPAK. Gathers can also be rapidly visualized in TKS for quick quality control, comparison to stack data and attributes, and prospect to analog comparisons.
While loading gathers into a project, users can generate offset or angle volumes, compute inside and outside mutes, and adjust the vertical and lateral gain. These same processing capabilities are available when displaying and interpreting the loaded gathers. In addition, the user can apply bandpass filtering, phase rotation and can even display a range of seismic attributes calculated from a specific group of user selected gathers.
Benefits
- Enhanced productivity for prospect evaluation
- Integrated, interactive environment increases interpreter productivity
- Facilitates sharing of expertise
- Reduced risk and project costs
Key Features
- AVOPAK is part of SMT’s integrated KINGDOM® family of products
- Load into same survey as stacked data as another data type
- Display using same methods as stacked data in both 2D and 3D
- Data Conditioning and AVO attributes
- Industry standard AVO attributes, Shuey 2 and 3 term, Verm-Hilterman
- Linear regression analysis - Nth order polynomial fits
- AVO attribute extraction based on volume or horizon
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